XPS

Our X-Ray Photoelectron Spectrometer (XPS) is an important tool for surface analysis.

Analysis Chamber
- Single wavelength (1486.6eV) x-ray source
- EA 125 U5 hemispherical analyser with an XM 1000 monochromator
- CN 10 charge neutralizer
- HIS 13 VUV source for UPS (He I, He II wavelengths)
Preparation Chamber
- 4-grid SPECTA LEED
- ISE 5 Sputtering Source (Argon)
- FOCUS GmbH E-beam Evaporator: EFM 3T (Triple Pocket Evaporator)
- FOCUS GmbH E-beam Evaporator: EFM 3 (Single Pocket Evaporator)
- SPECS GmbH Differentially pumped Mini Plasma Hyrbid (Ion Beam and Atom Mode) Source-ECR (Oxygen)
  (more info on SPECS website here)